Granados X., Puig T., Obradors X., Sieger M., Barusco P., Palau M.d., Queraltу A., Gupta K., Saltarelli L., Meledin A.-2
Ключевые слова: HTS, coated conductors, transport currents, grain structure, grain boundaries, PLD process, microstructure, magnetic field distribution, substrate Ni-W, substrate stainless steel, critical caracteristics, Jc/B curves, peak effect, angular dependence, vortex structures, experimental results
Eisterer M., Holzapfel B., Hanisch J., Schultz L., Huhne R., Tendeloo G.V., Pahlke P., Lao M., Meledin A., Sieger M., Nielsch K., Ottolinger R.
Kursumovic A., MacManus-Driscoll J.L., Celentano G., Tendeloo G.V., Rizzo F., Augieri A., Bianchetti M., Meledin A., Sieger M., Hдnisch J., Hьhne R., Opherden L.
Ключевые слова: HTS, REBCO, coated conductors, nanodoping, nanoscaled effects, critical caracteristics, Jc/B curves, temperature distribution, pinning force, thickness dependence, comparison, critical current density, angular dependence, microstructure, PLD process, magnetic field dependence, substrate SrTiO3
Eisterer M., Schultz L., Huhne R., Tendeloo G.V., Pahlke P., Lao M., Meledin A., Sieger M., Nielsch K.
Ключевые слова: HTS, YBCO, coated conductors, fabrication, phase composition, pinning, PLD process, RABITS process, substrate Ni-W, IBAD process, substrate stainless steel, comparison, doping effect, X-ray diffraction, critical caracteristics, lattice parameter, critical current density, critical temperature, thickness dependence, microstructure, critical current, critical current density, experimental results
Ключевые слова: HTS, GdBCO, REBCO, coated conductors, films, YBCO, substrate single crystal, critical caracteristics, critical current density, local distribution, anisotropy, measurement technique, Hall sensor, Jc/B curves, comparison, remanent field, magnetic field distribution, critical current distribution, angular dependence
Schultz L., Huhne R., Tendeloo G.V., Strickland N.M., Wimbush S.C., Meledin A., Sieger M., Stafford B.H., Ottolinger R.
Eisterer M., Holzapfel B., Hanisch J., Schultz L., Kursumovic A., Huhne R., MacManus-Driscoll J.L., Usoskin A., Tendeloo G.V., Pahlke P., Lao M., Meledin A., Sieger M., Stafford B.H., Ottolinger R., Bauer M.*7 Nielsch K.
Eisterer M., Schultz L., Huhne R., Bauer M., Tendeloo G.V., Pahlke P., Lao M., Meledin A., Sieger M., Stafford B.H., Nielsch K., Ottolinger R.
Hanisch J., Huhne R., Huhtinen H., Paturi P., Driessche I.V., Backer M., Pollefeyt G., Sieger M., Rijckaert H., Keukeleere K.D., Roo J.D., Bennewitz .J., Hemgesberg M.
Ключевые слова: HTS, coated conductors, grain boundaries, PLD process, substrate Ni-W, YBCO, RABITS process, magnetic field distribution, critical caracteristics, angular dependence, transport currents, magnetic field dependence, IBAD process, chemical solution deposition, comparison, microstructure
Holzapfel B., Hanisch J., Schultz L., Huhne R., MacManus-Driscoll J.L., Nast R., Tendeloo G.V., Bianchetti M., Pahlke P., Meledin A., Sieger M., Opherden L.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, nanodoping, nanoscaled effects, pinning force, microstructure, resistive transition, critical caracteristics, Jc/B curves, critical current density, angular dependence, n-value, temperature dependence, magnetic field dependence, experimental results
Eisterer M., Holzapfel B., Hanisch J., Schultz L., Huhne R., Usoskin A., Tendeloo G.V., Pahlke P., Lao M., Meledin A., Sieger M., Stromer J.
Hanisch J., Schultz L., Huhne R., Usoskin A., Pahlke P., Sieger M., Stromer J., Chekhonin P., Skrotzki W.
Ключевые слова: HTS, YBCO, films, PLD process, RABITS process, substrate Ni-W, IBAD process, stainless steel, buffer layers, microstructure, measurement technique
Eisterer M., Holzapfel B., Hanisch J., Schultz L., Huhne R., Nast R., Tendeloo G.V., Bianchetti M., Sparing M., Pahlke P., Lao M., Meledin A., Sieger M., MacManus-Driscoll J.
Holzapfel B., Hanisch J., Schultz L., Huhne R., Nast R., Iida K., Sparing M., Reich E., Gaitzsch U., Pahlke P., Sieger M.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, doping effect, PLD process, RABITS process, nanodoping, nanoscaled effects, microstructure, texture, lattice parameter, composition, microstructure, critical caracteristics, Jc/B curves, pinning force, critical temperature, irreversibility fields, experimental results
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